Magnetic Domain Observation Technique using Scanning Electron Microscope

Observation of semiconductor elements using scanning electron microscope.

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

[A scanning electron microscope observation of Dictyocaulus filaria.].

In this study, D. filaria causing parasitic bronchopneumonia in sheep was observed using a scanning electron microscope. This parasite belongs to the Trichostrongyloidea super family. The oral opening of D. filaria was observed to be small and circular in shape. Lips were not evident. Any difference between anterior ends of male and female parasites was not observed in present study. In the fem...

Conventional Transmission Electron Microscope Observation of Electric and Magnetic Fields

Observation of Wet Samples Using a Novel Atmospheric Scanning Electron Microscope

The scanning electron microscope (SEM) has been used as a powerful tool for providing surface information of micro and nanostructures. In recent years, SEM methods for observing wet samples under atmospheric pressure have been reported by some investigators [1-2]. With these methods, the sample space is separated by a thin transparent membrane from vacuum environment where electron beam is prop...